SXD30M-150-500

X-PIPS™ Detector SDD
Manufactured by: The Spectroscopy Divison
Favorite this Product

SXD30M-150-500

X-PIPS™ Detector SDD
Manufactured by: The Spectroscopy Division
Favorite this Product

Comprises a hermetically sealed silicon drift detector (SDD) element with a low noise FET assembly and Peltier cooler, a reset type preamplifier, a HV bias supply, and a temperature controller.

Get More Info Data Sheet

Features

Detector System Includes:

  • Silicon Drift Detector (SDD)
  • Be Window
  • Preamplifier
  • HV Bias Supply
  • Peltier Cooler
  • Temperature Controller

Description

The X-PIPS Detector is a spectroscopy sub-system sensitive to X-rays and low-energy gamma rays. It comprises a hermetically sealed silicon drift detector (SDD) element with a low noise FET assembly and Peltier cooler, a reset type preamplifier, a HV bias supply, and a temperature controller. The detector element and FET are cooled and regulated to a stable temperature, ensuring stable operation in changing environmental conditions. The Beryllium entrance window is standard 0.5 mil.

The preamplifier has a digitally controlled reset mechanism providing fast reset time and excellent count rate performance. A reset inhibit signal is available to prevent storage of spurious pulses due to transient reset effects. The width of the inhibit output pulse can be set from 10 μs to 650 μs.

The energy resolution is guaranteed within an ambient temperature range of +10 °C to + 30 °C with the default factory settings.

The X-PIPS Detector has an internal multilayer collimator for improved peak to background.

Additional Information

Performance

  • Active Area – 30 mm2
  • Thickness – 0.5 mm
  • Resolution <145 eV (FWHM)*
  • Energy Range – 1 to 30 keV

Applications

  • X-ray Spectroscopy
  • X-ray Fluorescence
  • X-ray Diffraction
  • Mössbauer Spectroscopy
  • Densitometry
  • Many More

Support

Americas, Europe, Asia, Middle East, India, Africa
800 Research Parkway
Meriden CT, 06450


Worldwide Support and Sales for Spectroscopy and Waste Characterization products