ESLX-S and LTS Detectors

Segmented Planar Silicon-Lithium Detectors for X-ray and Charged Particle Measurements
Manufactured by: The Spectroscopy Divison
Favorite this Product

ESLX-S and LTS Detectors

Segmented Planar Silicon-Lithium Detectors for X-ray and Charged Particle Measurements
Manufactured by: The Spectroscopy Division
Favorite this Product

Segmentation techniques fit with all crystal designs: circular, rectangular, etc. ESLX-S detectors in a unique cryostat, offer high energy X-ray absorption or imaging capabilities.

Get More Info Data Sheet

Features

  • ESLX-S: For high performance X-ray measurements in Physics (PIXE, synchrotrons...), Non Destructive Assay and Medicine
  • LTS: For high performance charged particles measurements in Physics (Conversion Electrons, Mini-Orange) and RMS (air monitoring)
  • Mirion mature proprietary segmentation technique
  • Wide range of shapes (pixels, strips) and segmentations (straight strips, circular, single or double sided)
  • Excellent energy resolution (150 eV at 5.9 keV for ESLX-S, depending on geometries)
  • Good behavior at high count rates
  • Thickness up to 10 mm
  • Minimum pitch 2 mm
  • Crosstalk ≤1%
  • Double sided segmentation capability, using Mirion thin window proprietary technology
  • For ESLX-S: LN2, cryogenerator or Peltier cooling
  • LTS are used at room temperature but can be cooled by Peltier effect in case improved performances are required

Description

The Segmented Si(Li) detectors (ESLX-S and LTS) are manufactured using a proprietary technology allowing design of the unique segmented silicon detectors available worldwide.

Mirion has applied the photolithography proven techniques – usually employed in microelectronics – to Si(Li) diodes. Thus, all kinds of segmentation patterns are possible (straight or curved strips, pixels, etc.).

Mirion also offers a proprietary double sided thin window segmentation. This enables to build telescope systems consisting of several layers of Si(Li) detectors.

Segmentation offers many advantages:

  • High efficiency through best area coverage: Suppression of dead zones between consecutive strips.
  • Best granularity: Small pitch down to 2 mm.
  • Fastest response: Good behavior at high count rates (up to 1 million pulses per second) due to fast preamplifiers without any compromise on signal to noise ratio.
  • 2-sided photolithography capability, with pitches down to 2 mm.
  • Excellent FWHM resolution: typically 150 eV at 5.9 keV on cooled ESLX-S devices for X-ray measurements.
  • No measurable crosstalk.

Segmentation techniques fit with all crystal designs: circular, rectangular, etc.

Several Si(Li) detectors may be associated in arrays to increase angular coverage or may be stacked.

ESLX-S detectors in a unique cryostat, offer high energy X-ray absorption or imaging capabilities (gamma cameras).

ESLX-S detectors are cooled at liquid nitrogen temperature and withstand many thermal cycles.

Such characteristics make ESLX-S series the best choice for X-ray measurements in many applications such as physics experiments as well as non invasive detection.

LTS detectors are operated at room temperature or are peltier cooled for improved performances compared to those at room temperature.

Additional Information

Applications

  • PIXE (microprobes)
  • Synchrotron (EXAFS, medical beam lines)
  • Nuclear Physics
  • Non destructive control
  • Radiography
  • Imaging (gamma cameras)
  • Typically for LTS: CAM (Continuous Air Monitoring) on beta particles

Support

Americas
800 Research Parkway
Meriden CT, 06450


Worldwide Support and Sales for Spectroscopy and Waste Characterization products